Olympus Industrial NDT Equipment and Inspection Systems

Industrial videoscopes Series IPLEX (GX, GT, NX, G Lite, GAir)

Olympus IPLEX industrial videoscopes deliver remote visual inspection for internal cavities of machinery, gas turbines, combustion chambers, boiler tubes and precision cast components.

The systems feature interchangeable insertion tubes from 2.4 mm to 8.5 mm diameter with TrueFeel motorized articulation for responsive multi-directional tip steering.

Interchangeable optical tip adapters provide direct and side viewing with integrated stereo measurement capabilities for accurate flaw sizing, depth calculation and surface profile evaluation.

Heavy-duty tungsten braid Tapered Flex construction ensures superior abrasion resistance and smooth navigation through tight industrial channel bends.

Advanced PulsarPic image processors automatically balance illumination intensity and minimize optical noise in dark cavities, delivering crisp high-definition inspection visuals. The systems include high-capacity batteries, rugged transport cases and interchangeable light guides.

Specify insertion tube diameter and length (2.4 to 30 m), viewing direction (direct/side), articulation type and stereo measurement package.

Phased array ultrasonic flaw detectors OmniScan X3 and OmniScan MX2

Olympus OmniScan portable flaw detectors integrate phased array ultrasonic testing (PAUT), time-of-flight diffraction (TOFD) and total focusing method (TFM/FMC) acoustic imaging.

Supporting up to 32:128PR hardware architectures, these instruments deliver rapid inspection of pipeline girth welds, aerospace composite structures and heavy-wall pressure vessels with real-time volumetric flaw reconstruction.

Full matrix capture (FMC) and TFM imaging eliminate the complexity of manual focal law adjustments by maintaining optimal acoustic focus across the entire inspection volume.

The units interface with rugged Rexolite wedges with integrated couplant irrigation ports, specialized manual and motorized scanners (Cobra, MapROVER, AxSEAM), and heavy-duty Hypertronics multichannel probe cables.

Onboard analysis software exports complete volumetric datasets including A-scans, B-scans and C-scans for formal reporting.

Specify channel architecture (16:64, 16:128, 32:128), TFM mode, phased array probe frequency, Rexolite wedges and scanner model.

Conventional ultrasonic flaw detectors Series EPOCH (EPOCH 650, 6LT)

Olympus EPOCH ultrasonic flaw detectors deliver field-proven conventional flaw sizing for heavy forgings, castings, structural steel, rail axles and critical weld joints.

Equipped with high-contrast sunlight-readable displays, tunable digital filters from 0.2 MHz to 26.5 MHz and PerfectPulse square wave pulsers with adjustable energy and damping, these IP66/IP67-rated instruments excel in harsh fabrication and field environments.

Built-in DGS/AVG sizing curves, AWS D1.1/D1.5 weld rating software, and dynamic DAC/TVG correction curves enable operators to rapidly determine equivalent flaw reflector sizes and spatial coordinates with certified accuracy.

The flaw detectors support direct waveform data logging to SD memory cards and rapid report export via USB.

Specify frequency band, probe connectors (BNC/LEMO), software options (DGS/AVG, AWS D1.1, DAC/TVG) and battery capacity.

Handheld XRF analyzers Series Vanta (Vanta Max, Core, Element)

Olympus Vanta handheld XRF spectrometers provide rapid, non-destructive elemental analysis for alloy sorting, mining exploration, precious metal grading, recycling catalysts and environmental soil testing.

Featuring 50 kV X-ray tubes with Rh, W or Ag anodes, silicon drift detectors (SDD) with proprietary Axon pulse processing and IP54/IP55 ruggedized enclosures, Vanta analyzers ensure laboratory-grade analytical accuracy in the field.

Axon signal processing virtually eliminates electronic temperature drift, maintaining high count rates and measurement reproducibility regardless of external thermal fluctuations.

The analyzers instantly identify stainless steels, nickel superalloys, titanium and aluminum grades, perform RoHS compliance verification and detect heavy metal contaminants in seconds. Workstation test stands with radiation shielding enable safe benchtop laboratory operation.

Specify analyzer model (Max, Core, Element), X-ray tube anode type (Rh/W/Ag), and analytical calibration mode (Alloy Plus, Geochem, RoHS).

Ultrasonic thickness gages 38DL PLUS, 27MG and Magna-Mike 8600 Hall effect gage

Precision thickness gages Olympus 38DL PLUS and 27MG measure remaining wall thickness of piping, boiler tubes and pressure vessels affected by internal corrosion from 0.08 mm to 635 mm with automatic temperature compensation.

The advanced 38DL PLUS supports dual and single element transducers, Thru-Coat echo-to-echo technology to measure true metal thickness through protective paint layers, and internal oxide scale thickness quantification.

The Magna-Mike 8600 Hall effect thickness gage provides non-destructive measurements of non-ferrous materials such as plastic bottles, composite aircraft panels and glass containers up to 25.4 mm using precision calibrated magnetic target spheres and wire targets.

Internal non-volatile dataloggers and companion software generate cross-sectional B-scan profiles for corrosion mapping.

Specify measurement technique (ultrasonic/Hall effect), thickness range, surface temperature and dual/single element probe configuration.

Upright metallurgical and industrial microscopes BX53M, MX63 and STM7

Olympus BX53M and MX63 industrial microscopes deliver high-resolution metallurgical analysis for alloy grain structures, semiconductor wafers and electronic PCBs.

The modular architecture supports brightfield (BF), darkfield (DF), Nomarski differential interference contrast (DIC) and directional MIX illumination.

The UIS2 infinity-corrected optical system delivers razor-sharp contrast, flat field of view and true color fidelity free from chromatic aberrations.

STM7 measuring microscope platforms feature 0.1 µm resolution optical encoders, coordinate stages up to 300×300 mm travel and motorized Z-axis autofocus for precision dimensional verification of machined parts and semiconductor micro-devices.

The frames accommodate motorized revolving nosepieces and high-speed DP digital cameras.

Specify observation modes (BF/DF/DIC/MIX), stage travel dimensions, motorized nosepiece options and illumination light source.

Stereo microscopes SZX16, SZX7 and digital inspection systems DSX1000

Olympus SZX16 research stereo microscopes feature a Galilean optical system with a 16.4:1 zoom ratio and numerical aperture up to 0.3 NA, providing exceptional depth of field and stereoscopic 3D clarity for microelectronics assembly and soldering quality control.

The DSX1000 digital microscope platform integrates a motorized ±90° tilting frame, one-click contrast switching and 3D surface profile metrology algorithms.

Users can examine samples from arbitrary angles without manipulating the specimen on the stage, while advanced image stitching algorithms generate ultra-wide panoramic high-resolution images with extended depth of field.

The systems feature shadowless LED ring illuminators and coaxial lighting for mirrored surfaces.

Specify zoom body model, objective lens type (DF PLAPO), illumination (LED ring/coaxial) and boom/tilting stand configuration.

UIS2 infinity-corrected objectives (MPLAPON, LMPLFLN) and DP digital cameras

Olympus UIS2 optical components include plan apochromat and semi-apochromat metallurgical objectives from the MPLAPON, MPlanFL N, LMPLFLN (long working distance) and SLMPLN (super long working distance for deep cavities and heating stages) series.

Digital microscope cameras DP74, DP28, DP23 and SC180 feature USB 3.0 CMOS sensors delivering high frame rate imaging, calibrated color fidelity and software integration.

UIS2 series objectives feature high numerical apertures and long working distances to protect optical elements from accidental collisions with uneven samples during wafer inspection, metallographic cross-sections and composite polymer research.

Direct C-Mount optical couplers in various magnification factors ensure seamless camera-to-microscope integration.

Specify objective series and magnification (5x to 100x), NA, working distance, camera model (DP74/28/23) and C-mount magnification adapter.