RHK Technology / RHK Scanning Probe Microscopes and Controllers

Ultra-high vacuum probe microscopes, closed-cycle cryogenic platforms, and digital controllers by RHK Technology / RHK: laboratory instrument selection and technical parameters.

Cryogenic Probe Microscopes PanScan Freedom and Freedom II

RHK Technology PanScan Freedom and Freedom II systems provide closed-cycle cooling without liquid helium. The instruments feature a rigid scan head, integrated superconducting magnet, and optical collection channels for high-stability low-temperature spectroscopy.

Closed-cycle cooling architecture down to 7 Kelvin tip and specimen base
Integrated superconducting magnet assembly for high-field vacuum measurements
High-efficiency optical collection path for tip-enhanced Raman spectroscopy
Interchangeable probe sensor cartridges and specialized scanning tip mounts

Ultra-High Vacuum Probe Microscopes Beetle UHV VT Series

RHK Technology Beetle UHV VT STM and AFM platforms utilize a temperature-compensated Besocke beetle scan head with piezo walker motion. The instruments deliver atomic resolution on conductive surfaces within ultra-clean vacuum chambers.

Ultra-high vacuum chamber maintaining operating base pressure below 10^-10 Torr
Thermally balanced beetle scan head design with three piezo inertial walker legs
Variable temperature operation regime from cryogenic conditions up to 400 Kelvin
Standard vacuum flanges for direct integration with surface preparation chambers

Digital Scanning Controllers R9plus SPM Controller

RHK Technology R9plus controllers combine complete scanning probe control functions within a single unified enclosure. The hardware platform features a native 64-bit architecture, six lock-in amplifiers, and low-noise digital converters.

Six internal digital lock-in amplifiers with demodulation bandwidth up to 100 kHz
Dual hardware phase-locked loops for dynamic non-contact scanning probe methods
Nine configurable digital feedback loop controllers for multi-channel scanning
High-speed spectroscopy data streaming through dedicated USB 3.0 interfaces

Modular Hardware Control Platforms R10 Controller

RHK Technology R10 hardware units are engineered for multi-probe and customized scanning probe systems. The platform delivers expanded I/O channels, programmable FPGA logic, and dual-probe independent scanning capabilities.

Multi-channel signal architecture with native dual-probe independent scanning
Ultra-low-noise high-voltage amplifiers for precision piezo tube positioning
Open Inventor SDK interface for direct programming via LabVIEW, MATLAB, and Python
Hardware filters for comprehensive attenuation of electrical noise and harmonics

Scan Heads, Piezo Tubes, and Specimen Stages

RHK Technology PanScan and Beetle scan heads provide sub-picometer probe positioning. Segmented piezo ceramic actuators undergo calibration along X, Y, and Z axes with position feedback to eliminate mechanical hysteresis and creep.

Segmented piezo ceramic tube actuators with scan ranges up to 10x10 microns
Precision guide surfaces and polished sapphire prisms for stick-slip walking
Interchangeable sample plates with integrated resistive or electron heating
Shielded probe holders engineered to minimize parasitic electrical capacitance

Low-Noise IVP Preamplifiers and Vacuum Cable Assemblies

RHK Technology IVP current-to-voltage preamplifiers provide amplification of tunneling signals down to the picoampere range. Specialized triaxial vacuum cabling protects measurement integrity against environmental interference.

Current preamplifier units with conversion gains reaching up to 10^10 V/A
Ultra-high vacuum internal wiring harnesses featuring low-outgassing insulation
Hermetic electrical feedthroughs in SMA, BNC, and triaxial formats on CF flanges
Electrochemical etching controllers for sharp tungsten and Pt-Ir scanning tips

Calibration Procedures for SPM Scan Heads

Precision calibration of RHK Technology PanScan and Beetle scanning tubes is conducted using standard calibration gratings with known atomic step heights.

Service specialists map three-dimensional piezo ceramic response across X, Y, and Z axes, establishing voltage sensitivity coefficients under dynamic excitation. Integrated algorithms within R9plus controllers compensate for mechanical hysteresis, creep, and non-linear tube deflection.

Routine verification of deflection coefficients eliminates scaling errors during spectroscopic imaging.

Configuring R9plus Digital Feedback Loops

The digital architecture of the RHK Technology R9plus controller allows custom tuning of up to nine independent feedback loops. For scanning tunneling microscopy, a logarithmic regulation loop maintains tip-to-sample spacing, balancing proportional and integral gains against head resonances.

In non-contact atomic force modes, integrated lock-in amplifiers and phase-locked loop units track cantilever phase shifts and amplitude dampening with sub-Hz precision and minimal perturbation.

Ultra-High Vacuum Maintenance and Chamber Bakeout

Atomic-scale resolution in Beetle UHV VT and PanScan Freedom systems depends on maintaining pristine ultra-high vacuum conditions.

Prior to high-resolution data acquisition, analytical chambers undergo controlled thermal bakeout up to 150 degrees Celsius to desorb residual water and ambient contaminants.

All internal wiring harnesses, SMA feedthroughs, and sensor headers utilize low-outgassing polymers and oxygen-free copper, keeping chamber pressures below 10^-10 Torr.

Noise Attenuation in High-Impedance Signal Paths

Measuring tunneling currents in the picoampere range requires shielding against electromagnetic interference and acoustic vibrations. RHK IVP current preamplifiers mount directly to vacuum feedthroughs, reducing input capacitance and maximizing measurement bandwidth.

Triaxial cabling with an active guard shell protects low-level signals on their route to the controller. Built-in digital low-pass filtering further attenuates ambient power grid harmonics.

Servicing Closed-Cycle Cryogenic Platforms

PanScan Freedom II platforms operate without liquid cryogens via closed-cycle helium circulation with mechanical decoupling from the scan head. Maintenance routines involve monitoring helium compressor pressures, thermal stage gradients, and shield cleanliness.

Pneumatic isolation dampens compressor vibrations, keeping probe tip mechanical noise within picometer tolerances. Periodic adsorber replacement preserves the 7 Kelvin base temperature over prolonged experimental runs.

Identification of RHK Components and Modules

Accurate specification of replacement parts for RHK Technology SPM platforms requires the equipment serial number, controller model (R9, R9plus, or R10), and vacuum chamber configuration.

Technical specialists assist with identifying piezo actuators, preamplifier units, signal harnesses, vacuum feedthroughs, optical windows, and heated specimen mounts. All hardware components undergo rigorous dimension and impedance verification to ensure plug-and-play integration.

RHK Technology / RHK and model names are trademarks of their respective owners and are used only to identify the equipment for which we source parts. SpareX is not an official dealer, distributor or representative of RHK Technology / RHK and is not affiliated with the trademark owner. Origin, documents and warranty are stated for each item in the quotation.